Two-Dimensional Profiling of Carriers in a Buried Heterostructure Multi-Quantum-Well Laser: Calibrated Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
doi 10.1116/1.1511211
Full Text
Abstract

Available in full text

Date
Authors
Publisher

American Vacuum Society

Related search

Scanning Spreading Resistance Microscopy of Two-Dimensional Diffusion of Boron Implanted in Free-Standing Silicon Nanostructures

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2005English

Observation of in Concentration Variations in InGaN∕GaN Quantum-Well Heterostructures by Scanning Capacitance Microscopy

Applied Physics Letters
AstronomyPhysics
2005English

Scanning Capacitance Microscopy Characterization of AIIIBV Epitaxial Layers

Materials Science-Poland
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2016English

Using Confocal Laser Scanning Microscopy, Scanning Electron Microscopy and Phase Contrast Light Microscopy to Examine Marine Biofilms

Aquatic Microbial Ecology
EvolutionEcologySystematicsAquatic ScienceBehavior
1998English

On Certain Mathematical Problems in Two-Photon Laser Scanning Microscopy

Mathematical Modeling and Analysis
ModelingAnalysisSimulation
2017English

Determination of Buried Dislocation Structures by Scanning Tunneling Microscopy

Physical Review B
2001English

Visualization of MeV Ion Impacts in Si Using Scanning Capacitance Microscopy

Physical Review B
2006English

Scanning Electron Microscopy

2013English

Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy

Journal of Research of the National Bureau of Standards
1987English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy