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Relative Contrast in A-Si and C-Si in ADF-STEM Imaging

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927603444243
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Abstract

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Categories
Instrumentation
Date

July 24, 2003

Authors
Z. YuD. A. MullerJ. Silcox
Publisher

Cambridge University Press (CUP)


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