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TID Effects in Deep N-Well CMOS Monolithic Active Pixel Sensors
doi 10.1109/radecs.2008.5782738
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Date
September 1, 2008
Authors
L. Ratti
C. Andreoli
L. Gaioni
M. Manghisoni
E. Pozzati
V. Re
G. Traversi
Publisher
IEEE
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