In-Situ Determination of the Effective Absorbance of Thinμc-Si:H Layers Growing on Rough ZnO:Al

EPJ Photovoltaics - France
doi 10.1051/epjpv/2013025
Full Text
Abstract

Available in full text

Date
Authors
Publisher

EDP Sciences

Related search

Rough-Wall Turbulent Boundary Layers

2004English

Absolute in Situ Measurement of Surface Dangling Bonds During A-Si:H Growth

Applied Physics Letters
AstronomyPhysics
2007English

Wide-Range Enhancement of Spectral Response by Highly Conductive and Transparentμc-SiOx:H Doped Layers Inμc-Si:H and a-Si:H/Μc-Si:H Thin-Film Solar Cells

International Journal of Photoenergy
Materials ScienceRenewable EnergyMolecular Physics,SustainabilityAtomicChemistryOpticsthe Environment
2016English

On the Determination of Effective Potentials in Supersymmetric Theories

Physics Letters, Section B: Nuclear, Elementary Particle and High-Energy Physics
High Energy PhysicsNuclear
1982English

On the Determination of Effective Potentials in Supersymmetric Theories

World Scientific Series in 20th Century Physics
2009English

Electromagnetic Wave Scattering From Rough Penetrable Layers

SIAM Journal on Mathematical Analysis
Computational MathematicsApplied MathematicsAnalysis
2011English

Autonomous In-Situ Analysis of the Upper Ocean: Construction of a Compact, Long Pathlength Absorbance Spectrometer

1999English

Research of Validation Parameters of the Spectrophotometric Quantitative Determination Method of Riboflavin by Specific Absorbance

Vìsnik farmacìï
2014English

The Wall Pressure Spectrum of High Reynolds Number Rough-Wall Turbulent Boundary Layers

2011English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy