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X-Ray Spectrometry in the Fast Lane: An Introduction to High Speed Digital Processing Techniques and Their Application to Emerging EDS Technologies

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927602101759
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Abstract

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Categories
Instrumentation
Date

August 1, 2002

Authors
P.M. GrudbergW.K. WarburtonJ.T. Harris
Publisher

Cambridge University Press (CUP)


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