Internal Energy Transfer to Secondary Ions in Electrospray Droplet Impact/Secondary Ion Mass Spectrometry

Journal of the Mass Spectrometry Society of Japan
doi 10.5702/massspec.56.33
Full Text
Abstract

Available in full text

Date
Authors
Publisher

The Mass Spectrometry Society of Japan

Related search

Secondary Ion Mass Spectrometry (SIMS)

Zairyo to Kankyo/ Corrosion Engineering
SurfacesAlloysMetalsMaterials ChemistryElectrochemistryFilmsCoatings
1993English

Secondary Ion Mass Spectrometry (SIMS)

English

Identification and Imaging of Modern Paints Using Secondary Ion Mass Spectrometry With MeV Ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
High Energy PhysicsInstrumentationNuclear
2017English

Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging

Microscopy and Microanalysis
Instrumentation
2016English

20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)

Biointerphases
Materials ScienceAstronomyGeneticsMolecular BiologyBiochemistryBiomaterialsChemistryPhysics
2016English

Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities

Microscopy and Microanalysis
Instrumentation
2017English

Characterization of Electrodeposited Metal Coatings by Secondary Ion Mass Spectrometry

Surface and Coatings Technology
SurfacesCondensed Matter PhysicsInterfacesMaterials ChemistryFilmsCoatingsChemistry
2006English

Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry

Journal of Research of the National Bureau of Standards
1988English

Ultra Shallow Depth Profiling by Secondary Ion Mass Spectrometry Techniques

AIP Conference Proceedings
AstronomyPhysics
2003English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy