Near Edge Fine Structure Analysis of Copper in Cu-Bi2Se3 Topological Insulators

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927614002529
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Proximity-Induced High-Temperature Superconductivity in the Topological Insulators Bi2Se3 and Bi2Te3

Nature Communications
AstronomyGeneticsMolecular BiologyBiochemistryChemistryPhysics
2012English

Surface State Magnetization and Chiral Edge States on Topological Insulators

Physical Review Letters
AstronomyPhysics
2013English

Core-Hole Effects on Theoretical Electron-Energy-Loss Near-Edge Structure and Near-Edge X-Ray Absorption Fine Structure of MgO

Physical Review B
2000English

Surface Edge State and Half-Quantized Hall Conductance in Topological Insulators

Physical Review B
2011English

Near-Edge X-Ray Absorption Fine Structure Studies of Cr1−xMxN Coatings

Journal of Alloys and Compounds
Mechanics of MaterialsAlloysMaterials ChemistryMetalsMechanical Engineering
2013English

Interplay of Bulk and Edge States in Transport of Two-Dimensional Topological Insulators

Physical Review B
2012English

Dynamical Separation of Bulk and Edge Transport in HgTe-Based 2D Topological Insulators

Physical Review Letters
AstronomyPhysics
2020English

Structural Properties of Bi2Te3 and Bi2Se3 Topological Insulators Grown by Molecular Beam Epitaxy on GaAs(001) Substrates

Applied Physics Letters
AstronomyPhysics
2011English

Microscopy and Chemical Analysis of Topological Insulator Bi2Se3 and Topological Crystalline Insulator SnTe Nanostructures

Microscopy and Microanalysis
Instrumentation
2015English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy