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Properties of SiC Resistive Memory for Harsh Environments
doi 10.7567/ssdm.2015.ps-4-9
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Abstract
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Date
September 29, 2015
Authors
K. Morgan
J. Fan
R. Huang
L. Zhong
R. Gowers
L. Jiang
K.De Groot
Publisher
The Japan Society of Applied Physics
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