Characterization of Short-Term Stress Applied to the Root System by Electrical Impedance Measurement in the First Leaf of Corn (≪i>Zea Mays</I> L.) and Pumpkin (≪i>Cucurbita Maxima</I> L.)

American Journal of Plant Sciences
doi 10.4236/ajps.2014.59142
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Scientific Research Publishing, Inc,


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