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Ion Imaging in a Focused Ion Beam Microscope: Modeling the Channeling Contrast to Construct EBSD-like Orientation Maps

doi 10.1002/9783527808465.emc2016.6804
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Abstract

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Date

December 20, 2016

Authors
Cyril LangloisThierry DouillardSébastien Dubail
Publisher

Wiley-VCH Verlag GmbH & Co. KGaA


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