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Microscopic Simulation of Xenon-Based Optical TPCs in the Presence of Molecular Additives

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Netherlands
doi 10.1016/j.nima.2017.08.049
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Categories
High Energy PhysicsInstrumentationNuclear
Date

January 1, 2018

Authors
C.D.R. AzevedoD. González-DíazS.F. BiagiC.A.B. OliveiraC.A.O. HenriquesJ. EscadaF. MonrabalJ.J. Gómez-CadenasV. ÁlvarezJ.M. Benlloch-RodríguezF.I.G.M. BorgesA. BotasS. CárcelJ.V. CarriónS. CebriánC.A.N. CondeJ. DíazM. DiesburgR. EsteveR. FelkaiL.M.P. FernandesP. FerrarioA.L. FerreiraE.D.C. FreitasA. GoldschmidtR.M. GutiérrezJ. HauptmanA.I. HernandezJ.A. Hernando MorataV. HerreroB.J.P. JonesL. LabargaA. LaingP. LebrunI. LiubarskyN. Lopez-MarchM. LosadaJ. Martín-AlboG. Martínez-LemaA. MartínezA.D. McDonaldC.M.B. MonteiroF.J. MoraL.M. MoutinhoJ. Muñoz VidalM. MustiM. Nebot-GuinotP. NovellaD. NygrenB. PalmeiroA. ParaJ. PérezM. QuerolJ. RennerL. RipollJ. RodríguezL. RogersF.P. SantosJ.M.F. dos SantosL. SerraD. ShumanA. SimónC. SofkaM. SorelT. StieglerJ.F. ToledoJ. TorrentZ. TsamalaidzeJ.F.C.A. VelosoR. WebbJ.T. WhiteN. Yahlali
Publisher

Elsevier BV

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