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Publications by Ömer Sevgili
Effect of Measurement Frequency on Admittance Characteristics in Al/P-Si Structures With Interfacial Native Oxide Layer
International Journal of Chemistry and Technology
Related publications
Phenomenological Theory on Si Layer-By-Layer Oxidation With Small Interfacial Islands
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Evidence of Annealing Effects on a High-Density Si/SiO2 Interfacial Layer
Applied Physics Letters
Astronomy
Physics
Admittance Characteristics of nBn Structures Based on HgCdTe Grown by Molecular Beam Epitaxy
Izvestiya vysshikh uchebnykh zavedenii. Fizika
Characteristics of Gettering Process in Multicrystalline Si Wafers With Combined Porous Si/Al Getters
Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Frictional Characteristics in Warm and Hot Upsetting of Hypereutectic Al-Si P/M Alloy.
Keikinzoku/Journal of Japan Institute of Light Metals
Mechanics of Materials
Alloys
Materials Chemistry
Metals
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Preparation of ZnO Film on P-Si and I-V Characteristics of P-Si/N-ZnO
Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
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Enhanced Fowler-Nordheim Tunneling Effect in Nanocrystallite Si Based LED With Interfacial Si Nano-Pyramids
Optics Express
Optics
Atomic
Molecular Physics,
Effect of Electroless Ni-P Plating on the Mechanical Properties of an Al-1.2%Si Alloy
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
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Effect of Al Replacing Si on Mechanical Properties of High Carbon Q–P–T Martensitic Steels
Heat Treatment and Surface Engineering
