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Publications by Øyvind Svensen
Mueller Matrix Measurements and Modeling Pertaining to Spectralon White Reflectance Standards
Optics Express
Optics
Atomic
Molecular Physics,
Related publications
Bidirectional Reflectance Distribution Function of Spectralon White Reflectance Standard Illuminated by Incoherent Unpolarized and Plane-Polarized Light
Applied Optics
Two-Channel Snapshot Mueller Matrix Polarimeter
Applied Optics
Mueller-Matrix Modeling of the Architecture in the Cuticle of the Beetle Chrysina Resplendens
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Mueller Matrix Interpolation in Polarization Optics
Journal of the Optical Society of America A: Optics and Image Science, and Vision
Pattern Recognition
Optics
Molecular Physics,
Computer Vision
Optical
Atomic
Magnetic Materials
Medicine
Electronic
Kinetic Modeling of Dissolution and Crystallization of Slurries With Attenuated Total Reflectance UV–Visible Absorbance and Near-Infrared Reflectance Measurements
Analytical Chemistry
Analytical Chemistry
Mueller Matrix Imaging Ellipsometry for Nanostructure Metrology
Optics Express
Optics
Atomic
Molecular Physics,
Mueller Matrix Polarimeter With Imperfect Compensators: Calibration and Correction
Robust Overlay Metrology With Differential Mueller Matrix Calculus
Optics Express
Optics
Atomic
Molecular Physics,
Metrology of Nanostructures by Tomographic Mueller-Matrix Scatterometry
Applied Sciences (Switzerland)
Instrumentation
Materials Science
Fluid Flow
Engineering
Computer Science Applications
Process Chemistry
Transfer Processes
Technology
