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Publications by A. Benso
DFT and BIST of a Multichip Module for High-Energy Physics Experiments
IEEE Design & Test of Computers
Static Analysis of SEU Effects on Software Applications
Automatic March Tests Generations for Static Linked Faults in SRAMs
Data Criticality Estimation in Software Applications
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs
Automating the IEEE Std. 1500 Compliance Verification for Embedded Cores
