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Publications by A. Todri

Multiple-Cell-Upsets on a Commercial 90nm SRAM in Dynamic Mode

English

Related publications

Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10T Subthreshold SRAM

IEEE Transactions on Nuclear Science

Electronic Engineering

High Energy Physics

English

Single Event Upsets Under 14-MeV Neutrons in a 28-Nm SRAM-based FPGA in Static Mode

IEEE Transactions on Nuclear Science

Electronic Engineering

High Energy Physics

English

Multiple Cell Upsets Correction for OLS Codes

International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering

English

Analysis of Resistive-Bridging Defects in SRAM Core-Cells: A Comparative Study From 90nm Down to 40nm Technology Nodes

English

SRAM Cell Design for Stability Methodology

English

A Review on Low Power Sram

International Journal of Recent Trends in Engineering and Research

English

Analysis of 6T SRAM Cell in Different Technologies

Circulation in Computer Science

English

Impact of Dynamic Voltage Scaling and Thermal Factors on FinFET-based SRAM Reliability

English

High-Speed Multiple-Mode Mass-Sensing Resolves Dynamic Nanoscale Mass Distributions

Nature Communications

Molecular Biology

English