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Publications by A. van den Bos
Experimental Design of Exit Wave Reconstruction From a Transmission Electron Microscope Defocus Series
IEEE Transactions on Instrumentation and Measurement
Electronic Engineering
Electrical
Instrumentation
How to Select the Items for the Shopping List of Future High Resolution Electron Microscopists?
Microscopy and Microanalysis
Instrumentation
Related publications
Focal-Series Reconstruction of Nanoparticle Exit-Surface Electron Wave
Microscopy and Microanalysis
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Electron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis
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Exit-Surface Dependency of Defocus Measured by Off-Axis Electron Holography
Microscopy and Microanalysis
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Transforming a Thermionic Transmission Electron Microscope Into an Electron Interferometer
Microscopy and Microanalysis
Instrumentation
Opening Multiwall Carbon Nanotubes in a Transmission Electron Microscope
Microscopy and Microanalysis
Instrumentation
Preparation of Transmission Electron Microscope Specimens From Ultra-Fine Fibers by a FIB Technique
Microscopy and Microanalysis
Instrumentation
Scanning Electron Microscope 3D Surface Reconstruction via Optimization
Microscopy and Microanalysis
Instrumentation
Various Specimen Preparation Methods for Transmission Electron Microscope
Journal of the Japan Society of Colour Material
High EDS Count Rates Achieved by Design Improvements for an Analytical Transmission Electron Microscope.
Microscopy and Microanalysis
Instrumentation
