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Publications by A.H. Buist

Experimental Design of Exit Wave Reconstruction From a Transmission Electron Microscope Defocus Series

IEEE Transactions on Instrumentation and Measurement

Electronic Engineering

Instrumentation

English

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Focal-Series Reconstruction of Nanoparticle Exit-Surface Electron Wave

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Electron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis

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Exit-Surface Dependency of Defocus Measured by Off-Axis Electron Holography

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Transforming a Thermionic Transmission Electron Microscope Into an Electron Interferometer

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Opening Multiwall Carbon Nanotubes in a Transmission Electron Microscope

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Preparation of Transmission Electron Microscope Specimens From Ultra-Fine Fibers by a FIB Technique

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Scanning Electron Microscope 3D Surface Reconstruction via Optimization

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Various Specimen Preparation Methods for Transmission Electron Microscope

Journal of the Japan Society of Colour Material

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High EDS Count Rates Achieved by Design Improvements for an Analytical Transmission Electron Microscope.

Microscopy and Microanalysis

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