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Publications by A.P. Strole
TESTCHIP: A Chip for Weighted Random Pattern Generation, Evaluation, and Test Control
IEEE Journal of Solid-State Circuits
Electronic Engineering
Electrical
Signature Analysis and Test Scheduling for Self-Testable Circuits
Related publications
Random Generation of Test Instances for Logic Optimizers
Proposal for On-Chip Generation and Control of Photon Hyperentanglement
Optics Letters
Optics
Atomic
Molecular Physics,
Design and Evaluation of a Hierarchical On-Chip Interconnect for Next-Generation CMPs
Ring Counter Based ATPG for Low Transition Test Pattern Generation
The Scientific World Journal
Biochemistry
Medicine
Genetics
Molecular Biology
Environmental Science
Fourier Analysis-Based Automatic Test Pattern Generation for Combinational Circuits
Pattern Generation and the Control of Nonlinear Systems
IEEE Transactions on Automatic Control
Control
Systems Engineering
Computer Science Applications
Electrical
Electronic Engineering
Mutation of Model Checker Specifications for Test Generation and Evaluation
A Microfluidic Chip for Liquid Metal Droplet Generation and Sorting
Micromachines
Control
Systems Engineering
Electrical
Mechanical Engineering
Electronic Engineering
Improved Weight Assignment for Logic Switching Activity During At-Speed Test Pattern Generation
