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Publications by AL Bleloch
Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?
Microscopy and Microanalysis
Instrumentation
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Recent Studies of Oxide-Semiconductor Heterostructures Using Aberration-Corrected Scanning Transmission Electron Microscopy
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Efficient Elastic Imaging of Single Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
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Depth Sectioning of Individual Dopant Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Applied Physics Letters
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Direct Visualization of Magnetic Skyrmion by Aberration-Corrected Differential Phase Contrast Scanning Transmission Electron Microscopy
Imaging ZnO Nanobelts and Nanobelt Supported Metal Nanocatalysts by Aberration-Corrected Scanning Transmission Electron Microscopy
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Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science
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Defect Characterization Using Transmission Scanning Electron Microscopy
Microscopy and Microanalysis
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Analysis of Nanostructures With Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
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Structure and Composition Analysis of Core-Shell Structure Bimetallic Concave Nanocubes by Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
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