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Publications by Akihiro Uenishi
Development of Biaxial Tensile Test System for In-Situ Scanning Electron Microscope and Electron Backscatter Diffraction Analysis
Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
Alloys
Condensed Matter Physics
Metals
Theoretical Chemistry
Materials Chemistry
Physical
Related publications
In-Situ UHV-Electron Microscopy With Scanning Tunneling Microscope
Microscopy and Microanalysis
Instrumentation
Biomineral Electron Backscatter Diffraction for Palaeontology
Palaeontology
Evolution
Ecology
Systematics
Behavior
Paleontology
Scanning Electron Microscope
Micron (1969)
Scanning Electron Microscope
Scanning Electron Microscope
Scanning Electron Microscope Pictures
Nature
Multidisciplinary
Analysis of Crystal Defects by Scanning Transmission Electron Microscopy (STEM) in a Modern Scanning Electron Microscope
Advanced Structural and Chemical Imaging
Nuclear Medicine
Radiology
Chemical Engineering
Spectroscopy
Imaging
Electron Backscatter Diffraction in the SEM: A Tutorial
Microscopy and Microanalysis
Instrumentation
Development of the Field Emission Type Scanning Electron Microscope in Hitachi.
Hyomen Kagaku
