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Publications by Akiyoshi Seko
Conductive Atomic Force Microscopy Analysis for Local Electrical Characteristics in Stressed SiO2Gate Films
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Related publications
Stressed-Metal Probes for Atomic Force Microscopy on Biological Samples
Microscopy and Microanalysis
Instrumentation
Electrochemical Current-Sensing Atomic Force Microscopy in Conductive Solutions
Nanotechnology
Mechanics of Materials
Electronic Engineering
Mechanical Engineering
Materials Science
Nanoscience
Electrical
Bioengineering
Nanotechnology
Chemistry
Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films With Au Nanoparticles
Scanning
Instrumentation
Optics
Atomic
Molecular Physics,
Conductive Atomic Force Microscopy Studies of Charged Domain Walls in KTiOPO4
AIP Advances
Nanotechnology
Astronomy
Physics
Nanoscience
Scanning Electron Microscopy and Atomic Force Microscopy of Chitosan Composite Films
Journal of the Chilean Chemical Society
Chemistry
Atomic Force Microscopy
Nanostructures for Efficient Hole Transport in Poly(3-Hexylthiophene) Film: A Study by Conductive Atomic Force Microscopy
Journal of Physical Chemistry C
Surfaces
Energy
Nanoscience
Theoretical Chemistry
Optical
Magnetic Materials
Films
Nanotechnology
Electronic
Coatings
Physical
Phase Mode Nanomachining on Ultra-Thin Films With Atomic Force Microscopy
Materials Letters
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Calibration-Independent Atomic Force Microscopy
Biophysical Journal
Biophysics
