Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Alessandro Paccagnella
Impact of Bias Temperature Instability on Soft Error Susceptibility
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hardware
Electronic Engineering
Electrical
Architecture
Software
Related publications
Modelling and Experimental Verification of the Impact of Negative Bias Temperature Instability on CMOS Inverter
Microelectronics Reliability
Surfaces
Electronic Engineering
Condensed Matter Physics
Electronic
Molecular Physics,
Nanoscience
Films
Optical
Electrical
Atomic
Magnetic Materials
Nanotechnology
Reliability
Safety
Coatings
Optics
Quality
Risk
Introduction to the Special Issue on Negative Bias Temperature Instability
IEEE Transactions on Device and Materials Reliability
Electronic Engineering
Risk
Electronic
Optical
Reliability
Electrical
Magnetic Materials
Safety
Quality
Influences of Initial Bulk Traps on Negative Bias Temperature Instability of HfSiON
Defects for Random Telegraph Noise and Negative Bias Temperature Instability
The Influence of Gate Poly-Silicon Oxidation on Negative Bias Temperature Instability in 3D FinFET
Analysis of the Relationship Between Random Telegraph Signal and Negative Bias Temperature Instability
Effect of Power Optimizations on Soft Error Rate
The Origin of Slow and Fast Trapping Under Bias Temperature Instability in HfSiO MOSFET
Dynamic Negative Bias Temperature Instability and Comprehensive Modeling in PMOS Body-Tied FinFETs
