Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Alexei Tivanski
Quantifying Reaction Spread and X-Ray Exposure Sensitivity in Hydrogen Silsesquioxane Latent Resist Patterns With X-Ray Spectromicroscopy
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Related publications
Soft X-Ray Spectromicroscopy Using Compact Scanning Transmission X-Ray Microscope at the Photon Factory
The Soft X-Ray Spectromicroscopy Beamline at SSRF
Quantitative Spectromicroscopy From Inelastically Scattered Photoelectrons in the Hard X-Ray Range
Applied Physics Letters
Astronomy
Physics
Standard X-Ray Diffraction Powder Patterns
Standard X-Ray Diffraction Powder Patterns :
Standard X-Ray Diffraction Powder Patterns :
Standard X-Ray Diffraction Powder Patterns
X-Ray Nanospectroscopic Research With Scanning Transmission X-Ray Microscopy
Journal of the Vacuum Society of Japan
Surfaces
Instrumentation
Interfaces
Spectroscopy
Materials Science
Standard X-Ray Diffraction Powder Patterns :
