Amanote Research

Amanote Research

    RegisterSign In

Discover open access scientific publications

Search, annotate, share and cite publications


Publications by Amber Rehana Solangi

Focused Ion Beam Tomography

2019English

Related publications

Investigation of Slice Thickness for FIB Tomography in a Plasma Focused Ion Beam System

Microscopy and Microanalysis
Instrumentation
2018English

In Situ Microfluidic Cryofixation for Cryo Focused Ion Beam Milling and Cryo Electron Tomography

Scientific Reports
Multidisciplinary
2019English

Focused Ion Beam (FIB) Based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)

Microscopy and Microanalysis
Instrumentation
2017English

Optimized Ordered Nanoprinting Using Focused Ion Beam

Advances in Materials Science and Engineering
2017English

Focused Ion Beam Based Sample Preparation Techniques

Microscopy and Microanalysis
Instrumentation
2002English

Focused Ion Beam (FIB) Microscopy and Technology

Microscopy and Microanalysis
Instrumentation
2002English

Focused-Ion Beam Induced Deposition of Copper

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
1993English

Dual-Beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology

Microscopy and Microanalysis
Instrumentation
2002English

Combining Atom-Probe Tomography and Focused-Ion Beam Microscopy to Study Individual Presolar Meteoritic Nanodiamond Particles

Microscopy and Microanalysis
Instrumentation
2013English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy