Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Amber Rehana Solangi
Focused Ion Beam Tomography
Related publications
Investigation of Slice Thickness for FIB Tomography in a Plasma Focused Ion Beam System
Microscopy and Microanalysis
Instrumentation
In Situ Microfluidic Cryofixation for Cryo Focused Ion Beam Milling and Cryo Electron Tomography
Scientific Reports
Multidisciplinary
Focused Ion Beam (FIB) Based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)
Microscopy and Microanalysis
Instrumentation
Optimized Ordered Nanoprinting Using Focused Ion Beam
Advances in Materials Science and Engineering
Focused Ion Beam Based Sample Preparation Techniques
Microscopy and Microanalysis
Instrumentation
Focused Ion Beam (FIB) Microscopy and Technology
Microscopy and Microanalysis
Instrumentation
Focused-Ion Beam Induced Deposition of Copper
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Dual-Beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology
Microscopy and Microanalysis
Instrumentation
Combining Atom-Probe Tomography and Focused-Ion Beam Microscopy to Study Individual Presolar Meteoritic Nanodiamond Particles
Microscopy and Microanalysis
Instrumentation