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Publications by Amy V Walker
Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
Microscopy and Microanalysis
Instrumentation
Related publications
Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Secondary Ion Mass Spectrometry (SIMS)
Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images
Microscopy and Microanalysis
Instrumentation
Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry
Journal of Research of the National Bureau of Standards
New Approach for Improvement of Secondary Ion Mass Spectrometry Profile Analysis
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Borophosphosilicate Glass Component Analysis Using Secondary Neutral Mass Spectrometry
Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Identification and Imaging of Modern Paints Using Secondary Ion Mass Spectrometry With MeV Ions
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
High Energy Physics
Instrumentation
Nuclear
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Identifying Individual Cell Types in Heterogeneous Cultures Using Secondary Ion Mass Spectrometry Imaging With C60Etching and Multivariate Analysis
Analytical Chemistry
Analytical Chemistry
