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Publications by Anton J. Bauer
Current Voltage Characteristics Through Grains and Grain Boundaries of High-K Dielectric Thin Films Measured by Tunneling Atomic Force Microscopy
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Piezoresponse Force Microscopy and Dielectric Spectroscopy Study of Ba0.6Sr0.4TiO3 Thin Films
Journal of Advanced Dielectrics
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Ultrahigh Dielectric Constant of Thin Films Obtained by Electrostatic Force Microscopy and Artificial Neural Networks
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Phase Mode Nanomachining on Ultra-Thin Films With Atomic Force Microscopy
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Conductance Through Atomic Contacts Created by Scanning Tunneling Microscopy
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Nanostructure of Thin Gold Films Investigated by Means of Atomic Force Microscopy and X-Ray Reflectometry Methods
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Microrheology of Human Lung Epithelial Cells Measured by Atomic Force Microscopy
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