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Publications by Arie Riessen

GGR Cutting‐Edge Review Atom Probe Tomography: Development and Application to the Geosciences

Geostandards and Geoanalytical Research
PetrologyGeochemistryGeology
2020English

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An Introduction to Atom Probe Tomography

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Application of Atom Probe Tomography to the Investigation of Atomic Force Microscope Tips and Interfacial Phenomena

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New Applications in Atom Probe Tomography

Microscopy and Microanalysis
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2013English

Atom Probe Tomography Characterization of Multilayer Films

Microscopy and Microanalysis
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2003English

Introduction: Special Issue on Atom Probe Tomography

Microscopy and Microanalysis
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2007English

Development of the Scanning Atom Probe

Microscopy and Microanalysis
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Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)

Advanced Materials Interfaces
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Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM

Microscopy and Microanalysis
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Atom-Probe Tomography of Semiconductor Materials and Device Structures

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2009English

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