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Publications by Arwa Ginwalla
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Related publications
Chemical Imaging of Buried Interfaces in OrganicInorganic Devices Using Focused Ion Beam-Time-Of-Flight-Secondary-Ion Mass Spectrometry
Imaging and Quantitative Analysis of Insecticide in Mosquito Net Fibers Using Time-Of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
PLoS ONE
Multidisciplinary
The Use of Time-Of-Flight Static Secondary Ion Mass Spectrometry Imaging for the Molecular Characterization of Single Aerosol Surfaces
Analytica Chimica Acta
Biochemistry
Environmental Chemistry
Analytical Chemistry
Spectroscopy
Gridless Ion Acceleration Systems for Time-Of-Flight Mass Spectrometry
Journal of the American Society for Mass Spectrometry
Structural Biology
Spectroscopy
Development of Source Apportionment of Individual Particle by High Resolution Time of Flight-Secondary Ion Mass Spectrometry
Journal of the Vacuum Society of Japan
Surfaces
Instrumentation
Interfaces
Spectroscopy
Materials Science
Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Secondary Ion Mass Spectrometry (SIMS)
Development of Ar Cluster-Ion Beam and Time-Of-Flight Secondary-Ion Mass Spectrometer
Physics and High Technology
Selective Reagent Ion-Time of Flight-Mass Spectrometry Study of Six Common Monoterpenes
International Journal of Mass Spectrometry
Instrumentation
Theoretical Chemistry
Condensed Matter Physics
Spectroscopy
Physical
