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Publications by Atsuto Kubo

A Metric for Measuring the Abstraction Level of Design Patterns

2007English

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A SystemC Register Model for Multiple Levels of Abstraction Using Advanced Object-Oriented Design Patterns

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A Metric for Quantifying Product-Level Circularity

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Abstraction of Computer Language Patterns

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High-Level Language Abstraction for Reconfigurable Computing

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A Topology-Based Metric for Measuring Term Similarity in the Gene Ontology

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Side-Channel Vulnerability Factor: A Metric for Measuring Information Leakage

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A Metric for Evaluating Density Level of Wireless Sensor Networks

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Design Patterns in Level Design: Common Practices in Simulated Environment Construction

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