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Publications by B. Hoex

Excellent Passivation of Highly Doped P-Type Si Surfaces by the Negative-Charge-Dielectric Al2O3

Applied Physics Letters

English

Direct and Highly Sensitive Measurement of Defect-Related Absorption in Amorphous Silicon Thin Films by Cavity Ringdown Spectroscopy

Applied Physics Letters

English

Silicon Surface Passivation by Atomic Layer Deposited Al2O3

Journal of Applied Physics

English