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Publications by B.W. Kempshall
In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials
Microscopy and Microanalysis
Instrumentation
Characterization of Si in a W Matrix Using Diffraction Contrast in the TEM
Microscopy and Microanalysis
Instrumentation
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Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;
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Comparison of Fib Tem Specimen Preparation Methods
Microscopy and Microanalysis
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Site-Specific TEM Specimen Preparation of Grain Boundary Corrosion in Nickel- Based Alloys Using the FIB “Plan-View Lift-Out” Technique
Microscopy and Microanalysis
Instrumentation
A Newly Developed Fib System for Tem Specimen Preparation
Microscopy and Microanalysis
Instrumentation
FIB Dual-Beam Sample Preparation for TEM Observation
Microscopy and Microanalysis
Instrumentation
EXpressLO™ for Fast and Versatile FIB Specimen Preparation
Microscopy and Microanalysis
Instrumentation
TEM Specimen Preparation for the Physical Sciences
Microscopy and Microanalysis
Instrumentation
FIB TEM Sample Preparation of Deeply Buried Interfaces
Microscopy and Microanalysis
Instrumentation
Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method
Microscopy and Microanalysis
Instrumentation