Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Brandon Van Leer
Investigation of Slice Thickness for FIB Tomography in a Plasma Focused Ion Beam System
Microscopy and Microanalysis
Instrumentation
New Workflows Broaden Access to S/Tem Analysis and Increase Productivity
Microscopy Today
Related publications
Focused Ion Beam Tomography
Focused Ion Beam (FIB) Microscopy and Technology
Microscopy and Microanalysis
Instrumentation
Focused Ion Beam (FIB) Based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)
Microscopy and Microanalysis
Instrumentation
Advantages of Broad Ion Beam (BIB) Processing Compared With Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids
Microscopy and Microanalysis
Instrumentation
Identification of Cleavage Origins Using Focused Ion Beam (FIB) Sectioning
Microscopy and Microanalysis
Instrumentation
Investigation of Plasma Characteristics and Ion Beam Extraction for a Micro RF Ion Thruster
TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN
In Situ Microfluidic Cryofixation for Cryo Focused Ion Beam Milling and Cryo Electron Tomography
Scientific Reports
Multidisciplinary
‘Slice & View’ Nano-Tomography of Porous Media Using FIB-SEM
Dual-Beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology
Microscopy and Microanalysis
Instrumentation
