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Publications by Brendan Foran

Interfacial Roughness of HfxSi1-xO2 High-K Films by TEM and AFM

Microscopy and Microanalysis
Instrumentation
2003English

Related publications

Nanocharacterization of Gallium Antimonide Substrate Surface by Tem/Afm

Microscopy and Microanalysis
Instrumentation
2002English

Characterizing Interfacial Roughness by Light Scattering Ellipsometry

AIP Conference Proceedings
AstronomyPhysics
2001English

Carbon Nanotube Membrane Probes:Immuno-Labeling by LM, AFM, Tem, & FESEM

Microscopy and Microanalysis
Instrumentation
2002English

TEM Study of Metal/Support Interaction in Pd/CexZr1-xO2 Model Auto Catalyst

Microscopy and Microanalysis
Instrumentation
2002English

AFM, SEM and TEM Studies on Porous Anodic Alumina

Nanoscale Research Letters
Materials ScienceNanotechnologyCondensed Matter PhysicsNanoscience
2010English

TEM Investigation of MoSeC Films

Microscopy and Microanalysis
Instrumentation
2008English

Decomposition of Magnesium Hydride Fiber Observed Using TEM and In-Situ AFM

Materials Transactions
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2011English

Growth Behaviour and Mechanical Properties of PLL/HA Multilayer Films Studied by AFM

Beilstein Journal of Nanotechnology
Electronic EngineeringMaterials ScienceNanoscienceElectricalNanotechnologyAstronomyPhysics
2012English

Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All Scales

ACS Applied Materials & Interfaces
MedicineMaterials ScienceNanotechnologyNanoscience
2018English

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