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Publications by Bruno Daudin
Direct Assessment of P–n Junctions in Single GaN Nanowires by Kelvin Probe Force Microscopy
Nanotechnology
Mechanics of Materials
Electronic Engineering
Mechanical Engineering
Materials Science
Nanoscience
Electrical
Bioengineering
Nanotechnology
Chemistry
Related publications
Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy
Direct Measurement of Minority Carriers Diffusion Length Using Kelvin Probe Force Microscopy
Applied Physics Letters
Astronomy
Physics
Dynamically Visualizing Battery Reactions by Operando Kelvin Probe Force Microscopy
Communications Chemistry
Biochemistry
Environmental Chemistry
Materials Chemistry
Chemistry
Electrical and Structural Characterization of GaN P-N Heterostuctures by Scanning Probe Microscopy
Microscopy and Microanalysis
Instrumentation
Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy
Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy
Axial P–n Junctions in GaN Microrods
Physica Status Solidi (B): Basic Research
Optical
Electronic
Condensed Matter Physics
Magnetic Materials
Investigation of the Cleaved Surface of a P–i–n Laser Using Kelvin Probe Force Microscopy and Two-Dimensional Physical Simulations
Applied Physics Letters
Astronomy
Physics
Direct Imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy
Scientific Reports
Multidisciplinary
