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Publications by C Szakal
Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images
Microscopy and Microanalysis
Instrumentation
Related publications
Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Secondary Ion Mass Spectrometry (SIMS)
Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
Microscopy and Microanalysis
Instrumentation
New Approach for Improvement of Secondary Ion Mass Spectrometry Profile Analysis
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Quantitative Analysis of Zn-Fe Alloy Galvanized Layer by Secondary Ion Mass Spectrometry
Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
Alloys
Condensed Matter Physics
Metals
Theoretical Chemistry
Materials Chemistry
Physical
Characterization of Electrodeposited Metal Coatings by Secondary Ion Mass Spectrometry
Surface and Coatings Technology
Surfaces
Condensed Matter Physics
Interfaces
Materials Chemistry
Films
Coatings
Chemistry
Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry
Journal of Research of the National Bureau of Standards
20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)
Biointerphases
Materials Science
Astronomy
Genetics
Molecular Biology
Biochemistry
Biomaterials
Chemistry
Physics