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Publications by C. Henry de Villeneuve
DNA Adsorption at Functionalized Si/Buffer Interfaces Studied by X-Ray Reflectivity
Journal of Chemical Physics
Medicine
Theoretical Chemistry
Astronomy
Physics
Physical
Related publications
Metal/Semiconductor Interfaces Studied by X-Ray Diffraction.
Materia Japan
Melting Behavior of Substrate-Free Polystyrene Surfaces Studied by X-Ray Reflectivity
Acta Crystallographica Section A Foundations of Crystallography
Molecular Orientation in Soft Matter Thin Films Studied by Resonant Soft X-Ray Reflectivity
Physical Review B
Surface Layering and Melting in an Ionic Liquid Studied by Resonant Soft X-Ray Reflectivity
Proceedings of the National Academy of Sciences of the United States of America
Multidisciplinary
X-Ray Metrology by Diffraction and Reflectivity
AIP Conference Proceedings
Astronomy
Physics
Nonspecular X-Ray Reflectivity Study of Roughness Scaling in Si/Mo Multilayers
Journal of Applied Physics
Astronomy
Physics
Si02/Si(100) Interfacial Lattice Strain Studied by Extremely Asymmetric X-Ray Diffraction
Transactions of the Materials Research Society of Japan
Adsorption at Solid-Liquid Interfaces Studied With Surface Sensitive Techniques
X-Ray-Absorption Dichroism of Dy at Interfaces
Physical Review B
