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Publications by Chenna Reddy Bheesayagari
Charge Trapping Control in MOS Capacitors
IEEE Transactions on Industrial Electronics
Control
Systems Engineering
Computer Science Applications
Electrical
Electronic Engineering
Related publications
Electron Beam Irradiation Effects in Thick-Oxide MOS Capacitors
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Super-Capacitors Take Charge in Germany
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
A Simple Method to Obtain the Generation Lifetime in MOS Capacitors
International Journal of New Technology and Research
Capacitance-Frequency Estimates of Border-Trap Densities in Multi-Fin MOS Capacitors
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Charge Trapping and Detrapping in Polymeric Materials
Journal of Applied Physics
Astronomy
Physics
Characterization, Preparation& Analysis of Oxide Based Capacitors for Gate of Mos Characteristics
International Journal of Advance Engineering and Research Development
Ge MOS Capacitors With Thermally Evaporated HfO[sub 2] as Gate Dielectric
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Space-Charge Effect on Electroresistance in Metal-Ferroelectric-Metal Capacitors
Scientific Reports
Multidisciplinary
Gate-Stack Engineering for Self-Organized Ge-Dot/SiO2/SiGe-Shell MOS Capacitors
Frontiers in Materials
Materials Science
