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Publications by Chun Meng Dou
Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias
IEEE Electron Device Letters
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Related publications
Defects for Random Telegraph Noise and Negative Bias Temperature Instability
Analysis of the Relationship Between Random Telegraph Signal and Negative Bias Temperature Instability
Interface Trap Effect on Gate Induced Drain Leakage Current in Submicron N-MOSFET's
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Random Telegraph Signals and 1/F Noise in a Silicon Quantum Dot
Journal of Applied Physics
Astronomy
Physics
Residual Fixed Pattern Noise and Random Telegraph Signal Noise of a MWIR T2SL Focal Plane Array
Impact of Gate Induced Drain Leakage on Overall Leakage of Submicrometer CMOS VLSI Circuits
IEEE Transactions on Semiconductor Manufacturing
Electronic Engineering
Industrial
Condensed Matter Physics
Manufacturing Engineering
Optical
Electrical
Magnetic Materials
Electronic
Impact of Bias Current Distribution on the Noise Figure and Power Saturation of a Multicontact Semiconductor Optical Amplifier
Optics Letters
Optics
Atomic
Molecular Physics,
Gate-Drain Capacitance Behaviour of the DMOS Power Transistor Under High Current Flow
Localization of Dark Current Random Telegraph Signal Sources in Pinned Photodiode CMOS Image Sensors
