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Publications by D Batchelor
Focused Ion Beam Characterization of Bicomponent Polymer Fibers
Microscopy and Microanalysis
Instrumentation
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Cryogenic Focused Ion Beam Characterization of Lithium Metal Anodes
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Characterization of Semiconductor Nanospikes Produced by Focused Ion Beam Erosion
Microscopy and Microanalysis
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Focused Ion Beam Tomography
Focused-Ion Beam Induced Deposition of Copper
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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Optimized Ordered Nanoprinting Using Focused Ion Beam
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Microscopy and Microanalysis
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Focused Ion Beam (FIB) Microscopy and Technology
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Dual-Beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology
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