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Publications by D. Dutartre
Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.
Microscopy and Microanalysis
Instrumentation
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Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy Using μSTEM
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SEM Image Observation Using an Electron Energy and Electron Take-Off Angle Filtered Detector
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Understanding DNA Organization in the Nucleus by Fluorescence Microscopy and Energy Filtered Transmission Electron Microscopy
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Imaging Localized Energy States in Silicon-Doped InGaN Nanowires Using 4D Electron Microscopy
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Analysis of Nanostructures With Scanning Transmission Electron Microscopy
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High Performance Digital Imaging for Transmission Electron Microscopy
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In Situ Transmission Electron Microscopy for Energy Applications
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