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Publications by D. Tsvetkov

Characterization of 2.5-Inch Diameter Bulk GaN Grown From Melt-Solution

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Crystallographic Properties of Bulk GaN Crystals Grown at High Pressure

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Growth and Characterization of Hexamethylenetetramine Crystals Grown From Solution

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Properties and Reliability of Ultrathin Oxides Grown on Four Inch Diameter Silicon Wafers by Microwave Plasma Afterglow Oxidation

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