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Publications by D.A. Yarekha
TEM Characterization of Polysilicon and Silicide Fin Fabrication Processes of FinFETs
Acta Physica Polonica A
Astronomy
Physics
Related publications
TEM Study of Silicide Formation and Microstructural Development of Ni/ Si1-xGex
Microscopy and Microanalysis
Instrumentation
Development and Characterization of Polysilicon Emitter Solar Cells.
Characterization of MOS Devices Fabricated on Laser Crystallized Polysilicon.
TEM Characterization of WS2 Nanotubes
Microscopy and Microanalysis
Instrumentation
Electrical Conductivity Extracted From Optical Characterization of Polysilicon Films
Silicide Formation on a Pt/SiO2 Model Catalyst Studied by TEM, EELS, and EDXS
Journal of Catalysis
Theoretical Chemistry
Catalysis
Physical
TEM Characterisation of Silicide Phase Formation in Ni-Based Ohmic Contacts to 4H N-SiC
Materials Transactions
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
A Novel Method for Direct TEM Study of Microstructure of Polysilicon Films Crystallized With and Without Underlying Oxide
Microscopy and Microanalysis
Instrumentation
Fabrication of a Biomimetic Corrugated Polysilicon Diaphragm With Attached Single Crystal Silicon Proof Masses
