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Publications by D.C. Joy
Modeling iSE Emission for Ion Beam Imaging
Microscopy and Microanalysis
Instrumentation
X-Ray Quantitative Microanalysis With an Annular Silicon Drift Detector
Microscopy and Microanalysis
Instrumentation
A Point Projection Microscope for Electron Interferometry in the Reflection Mode
Microscopy and Microanalysis
Instrumentation
Low Voltage Electron Holography - High Voltage Electron Holography
Microscopy and Microanalysis
Instrumentation
Low Voltage Nanotip Interferometry
Microscopy and Microanalysis
Instrumentation
Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy
Journal of Research of the National Bureau of Standards
