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Publications by D.J. AS

Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs

MRS Internet Journal of Nitride Semiconductor Research

English

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Electrical Characterization of Sputter Deposition Induced Defects in N-GaN

MRS Internet Journal of Nitride Semiconductor Research

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Electrical Characterization of Defects Induced by Electron Beam Exposure in Low Doped N -GaAs

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P- And N-Type Doping of MBE Grown Cubic GaN/GaAs Epilayers

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Study of Deep Traps in AlGaN/GaN High-Electron Mobility Transistors by Electrical Characterization and Simulation

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Structural and Electrical Characterization of GaN Thin Films on Si(100)

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Electrical Characterization of Ion Implantation Into GaAs

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Electrical Characterization of Rare-Earth Implanted GaN

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Localization and Electrical Characterization of Interconnect Open Defects

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