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Publications by Daniela Salgueiro
Operational Stability of Solution Based Zinc Tin Oxide/SiO2 Thin Film Transistors Under Gate Bias Stress
APL Materials
Materials Science
Engineering
Solution Combustion Synthesis: Applications in Oxide Electronics
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Positive Gate Bias Stress Instability of Carbon Nanotube Thin Film Transistors
Applied Physics Letters
Astronomy
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Instability of Amorphous-Indium Gallium Zinc Oxide (A-Igzo) Thin Film Transistors Under DC and AC Bias Stress
Nitrocellulose-Based Collodion Gate Insulator for Amorphous Indium Zinc Gallium Oxide Thin-Film Transistors
Journal of Information Display
Electronic Engineering
Electrical
Materials Science
Width Dependent Electrically Stress Degradation of Bottom Gate Amorphous Indium Gallium Zinc Oxide Thin Film Transistors
Low-Temperature, Solution-Processed, Transparent Zinc Oxide-Based Thin-Film Transistors for Sensing Various Solvents
Materials
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Condensed Matter Physics
Bias Stress Effects in Organic Thin Film Transistors
Instability of Threshold Voltage Under DC Drain Bias Stress in Pentacene-Based Organic Thin Film Transistors
Characteristics of Polycrystalline Silicon Thin-Film Transistors With Thin Oxide/Nitride Gate Structures
Optical Engineering
Engineering
Optics
Atomic
Molecular Physics,
Thin Film Transistors: Flexible Zinc-Tin Oxide Thin Film Transistors Operating at 1 kV for Integrated Switching of Dielectric Elastomer Actuators Arrays (Adv. Mater. 30/2017)
Advanced Materials
Mechanics of Materials
Materials Science
Nanotechnology
Mechanical Engineering
Nanoscience
