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Publications by Dave Diercks
Targeting Grain Boundaries for Structural and Chemical Analysis Using Correlative EBSD, TEM and APT
Microscopy and Microanalysis
Instrumentation
Related publications
Correlative Transmission EBSD-APT Analysis of Grain Boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 Based Thin-Film Solar Cells
Microscopy and Microanalysis
Instrumentation
EBSD Analysis of Orientation Gradients Developed Near Grain Boundaries
Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
EBSD Analysis Optimised for Twin-Related Boundaries
Microscopy and Microanalysis
Instrumentation
APT/LEDA RFQ and Support Frame Structural Analysis
Chemical and Structural Effects on Ionic Conductivity at Columnar Grain Boundaries in Yttria-Stabilized Zirconia Thin Films
Journal of the Ceramic Society of Japan
Materials Chemistry
Chemistry
Condensed Matter Physics
Composites
Ceramics
Microstructural Characterization of a Thermal Barrier Coating System Using SEM, TEM and APT Techniques
Microscopy and Microanalysis
Instrumentation
Visualization of Crystal Orientation and the Granulate Sub-Grain Size in Lithium Ion Batteries by Means of EBSD and Correlative Microscopy
Microscopy and Microanalysis
Instrumentation
Foreword: Structural Transitions and Local Deformation Processes at and Near Grain Boundaries
Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Mechanics of Materials
Alloys
Condensed Matter Physics
Metals
Interaction Between Dislocations and Σ = 51 and Σ = 19 Tilt Grain Boundaries in Germanium: Study by In-Situ, TEM and HREM
Microscopy Microanalysis Microstructures
