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Publications by David C Joy
Electron-Beam Deposition of Metals for Mask Repair
Microscopy and Microanalysis
Instrumentation
Introduction to the Scanning Electron Microscope
Microscopy and Microanalysis
Instrumentation
A Novel Technique for Visualizing Electron Beam Induced Charging
Microscopy and Microanalysis
Instrumentation
Is SEM Noise Gaussian?
Microscopy and Microanalysis
Instrumentation
Advanced Instrumentation for Low Voltage Scanning Microscopy
Microscopy and Microanalysis
Instrumentation
The Energy Spectra of Secondary Electrons
Microscopy Today
