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Publications by David W. Saxey

GGR Cutting‐Edge Review Atom Probe Tomography: Development and Application to the Geosciences

Geostandards and Geoanalytical Research
PetrologyGeochemistryGeology
2020English

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An Introduction to Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2003English

Application of Atom Probe Tomography to the Investigation of Atomic Force Microscope Tips and Interfacial Phenomena

English

New Applications in Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2013English

Atom Probe Tomography Characterization of Multilayer Films

Microscopy and Microanalysis
Instrumentation
2003English

Introduction: Special Issue on Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2007English

Development of the Scanning Atom Probe

Microscopy and Microanalysis
Instrumentation
2003English

Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)

Advanced Materials Interfaces
Mechanics of MaterialsMechanical Engineering
2017English

Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM

Microscopy and Microanalysis
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2013English

Atom-Probe Tomography of Semiconductor Materials and Device Structures

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2009English

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