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Publications by De Ching Shie
Soft Breakdown of Hafnium Oxynitride Gate Dielectrics
Journal of Applied Physics
Astronomy
Physics
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Turnaround of Hysterisis for Capacitance–voltage Characteristics of Hafnium Oxynitride Dielectrics
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The Characteristics of Hole Trapping in HfO2∕SiO2 Gate Dielectrics With TiN Gate Electrode
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Degradation of Polycrystalline HfO2-based Gate Dielectrics Under Nanoscale Electrical Stress
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Ultimate Scaling of High-K Gate Dielectrics: Current Status and Challenges
Electrical Properties of Crystalline YSZ Films on Silicon as Alternative Gate Dielectrics
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Noise in Si and SiGe MOSFETs With High-K Gate Dielectrics
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Cinnamate-Functionalized Natural Carbohydrates as Photopatternable Gate Dielectrics for Organic Transistors