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Publications by E. Okunishi
Observation of Cross Sectional Semiconductor Sample With Newly Developed SEI/STEM/TEM Microscope
Microscopy and Microanalysis
Instrumentation
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A Newly Developed PC Controlled 200kV FE-TEM
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Automated S/Tem Sample Preparation for Semiconductor Process Support
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STEM Scanning Mode Observation of Semiconductor Devices
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Li K-Emission Measurements Using a Newly Developed SXES-TEM Instrument
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Cross Sectional TEM Observation of Gas-Ion-Irradiation Induced Surface Blisters and Their Precursors in SiC
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Observation of Oriented Organic Semiconductor Using Photo-Electron Emission Microscope (PEEM) With Polarized Synchrotron
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Cross-Section of Asbestos Prepared for TEM/STEM With Ion Slicer
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