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Publications by E. Okunishi

Observation of Cross Sectional Semiconductor Sample With Newly Developed SEI/STEM/TEM Microscope

Microscopy and Microanalysis
Instrumentation
2003English

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A Newly Developed PC Controlled 200kV FE-TEM

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A Newly Developed Fib System for Tem Specimen Preparation

Microscopy and Microanalysis
Instrumentation
2002English

FIB Dual-Beam Sample Preparation for TEM Observation

Microscopy and Microanalysis
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2003English

Automated S/Tem Sample Preparation for Semiconductor Process Support

Microscopy Today
2007English

STEM Scanning Mode Observation of Semiconductor Devices

Microscopy and Microanalysis
Instrumentation
2003English

Li K-Emission Measurements Using a Newly Developed SXES-TEM Instrument

Microscopy and Microanalysis
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2010English

Cross Sectional TEM Observation of Gas-Ion-Irradiation Induced Surface Blisters and Their Precursors in SiC

Materials Transactions
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2003English

Observation of Oriented Organic Semiconductor Using Photo-Electron Emission Microscope (PEEM) With Polarized Synchrotron

Molecular Crystals and Liquid Crystals
Materials ScienceChemistryCondensed Matter Physics
2015English

Cross-Section of Asbestos Prepared for TEM/STEM With Ion Slicer

Microscopy and Microanalysis
Instrumentation
2010English

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